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Record identifier : 568670
Personal Name - Primary Intelectual Responsibility : Zhang, Bin
Title and statement of responsibility : IC design for reliability [Thesis]
Publication, Distribution,Etc. : The University of Texas at Austin, 2009
Language of the Item : eng
Body granting the degree : The University of Texas at Austin
Summary or Abstract : As the feature size of integrated circuits goes down to the nanometer scale, transient and permanent reliability issues are becoming a significant concern for circuit designers. Traditionally, the reliability issues were mostly handled at the device level as a device engineering problem. However, the increasing severity of reliability challenges and higher error rates due to transient upsets favor higher-level design for reliability (DFR). In this work, we develop several methods for DFR at the circuit level..
Topical Name Used as Subject : Electrical engineering
Information of biblio record : TL
 
 
 
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